Nikolaeva E. «Test generation for single and multiple stuck-at faults of a combination cir-cuit designed by covering shared free BDD with CLBs » // 2009. №1 (6) C.81-98
Ostanin Sergey A., Nikolaeva Ekaterina A., Matrosova Anjela Yu., Kirienko Irina E. «Fully delay and multiple stuck-at fault testable sequential circuit design» // Tomsk State University Journal of Control and Computer Science 2015. №4(33) C.82-90
